Modern technology builds on abstractions. Most application programmers today don’t know what a non-maskable interrupt is, nor should they have to. Even fewer understand register coloring or ...

A convergence of DFT techniques and the proliferation of in-silicon monitors can flag potential failures before they occur.

The number and variety of test interfaces, coupled with increased packaging complexity, are adding a slew of new challenges.

Ironwood Electronics has introduced the Raptor line of automatic test equipment (ATE) test contactors. The design uses a ...